The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 04, 2020
Filed:
Oct. 26, 2018
Otsuka Electronics Co., Ltd., Osaka, JP;
Otsuka Electronics Co., Ltd., Osaka, JP;
Abstract
An optical characteristics measuring method for measuring optical characteristics of a subject, the optical characteristics measuring method including: a step of acquiring one or more captured images including the subject, using an image capturing apparatus that is located at a predetermined distance from the subject, and is configured to be displaceable relative to the subject, while maintaining the predetermined distance; and a step of creating, based on the one or more captured images thus acquired, a virtual image including the subject and acquired from one or more analysis points each located at a position other than a position on a plane that includes the trajectory of the image capturing apparatus.