The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 04, 2020

Filed:

Mar. 06, 2018
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Mustafa N. Kaynak, San Diego, CA (US);

Sampath K. Ratnam, Boise, ID (US);

Zixiang Loh, Folsom, CA (US);

Nagendra Prasad Ganesh Rao, Folsom, CA (US);

Larry J. Koudele, Erie, CO (US);

Vamsi Pavan Rayaprolu, San Jose, CA (US);

Patrick R. Khayat, San Diego, CA (US);

Shane Nowell, Boise, ID (US);

Assignee:

MICRON TECHNOLOGY, INC., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/07 (2006.01); G06F 3/06 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0653 (2013.01); G06F 3/0619 (2013.01); G06F 3/0634 (2013.01); G06F 3/0659 (2013.01); G06F 3/0679 (2013.01); G06F 11/073 (2013.01); G06F 11/076 (2013.01);
Abstract

A temperature related to a memory device is identified. It is determined whether the temperature related to the memory device satisfies a threshold temperature condition. Responsive to detecting that the temperature related to the memory device satisfies the threshold temperature condition, a parameter for a programming operation is adjusted from a first value to a second value to store data at the memory device.


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