The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Dec. 01, 2017
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventors:

Rong Yao Chang, Shanghai, CN;

Yi Ying Zhang, Shanghai, CN;

Hai Yang Zhang, Shanghai, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/768 (2006.01); H01L 23/522 (2006.01); H01L 23/528 (2006.01); H01L 27/1157 (2017.01); H01L 27/11575 (2017.01); H01L 27/11582 (2017.01);
U.S. Cl.
CPC ...
H01L 21/76816 (2013.01); H01L 21/76877 (2013.01); H01L 23/5226 (2013.01); H01L 23/5283 (2013.01); H01L 27/1157 (2013.01); H01L 27/11575 (2013.01); H01L 27/11582 (2013.01);
Abstract

A semiconductor device and a method for fabricating the semiconductor device are provided. The method includes forming a first composite structure, including a plurality of first composite layers, on a substrate, and forming a second composite structure, including a plurality of second composite layers on a surface portion of the first composite structure. The method also includes forming a first mask layer covering a sidewall of the second composite structure and a surface portion of the first composite structure and exposing at least another surface portion of the first composite structure. In addition, the method includes forming a second mask layer, on a surface portion of the second composite structure and spaced apart from the first mask layer by a first annular opening. Further, the method includes etching a top first layer of the first composite layers and a top first layer of the second composite layers.


Find Patent Forward Citations

Loading…