The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Sep. 25, 2018
Applicant:

Kla-tencor Corporation, Milpitas, CA (US);

Inventors:

Ilya Bezel, Mountain View, CA (US);

Eugene Shifrin, Sunnyvale, CA (US);

Gildardo Delgado, Livermore, CA (US);

Rudy F. Garcia, Union City, CA (US);

Assignee:

KLA-Tencor Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/26 (2006.01); H01J 37/08 (2006.01); H01J 37/304 (2006.01); H01J 37/28 (2006.01); H01J 37/317 (2006.01); H01J 37/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/265 (2013.01); H01J 37/00 (2013.01); H01J 37/08 (2013.01); H01J 37/28 (2013.01); H01J 37/304 (2013.01); H01J 37/3174 (2013.01);
Abstract

An imaging system utilizing atomic atoms is provided. The system may include a neutral atom source configured to generate a beam of neutral atoms. The system may also include an ionizer configured to collect neutral atoms scattered from the surface of a sample. The ionizer may also be configured to ionize the collected neutral atoms. The system may also include a selector configured to receive ions from the ionizer and selectively filter received ions. The system may also include one or more optical elements configured to direct selected ions to a detector. The detector may be configured to generate one or more images of the surface of the sample based on the received ions.


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