The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Dec. 24, 2018
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;

Inventors:

Nien-Yu Tsai, Taichung, TW;

Chin-Chang Hsu, Banqiao, TW;

Hsien-Hsin Sean Lee, Duluth, GA (US);

Wen-Ju Yang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); H01L 27/00 (2006.01); G06F 30/392 (2020.01); G06F 30/398 (2020.01); H01L 27/02 (2006.01); G06F 119/18 (2020.01); G06F 30/39 (2020.01);
U.S. Cl.
CPC ...
G06F 30/392 (2020.01); G06F 30/398 (2020.01); H01L 27/0203 (2013.01); H01L 27/0207 (2013.01); G06F 30/39 (2020.01); G06F 2119/18 (2020.01);
Abstract

A standard cell for a semiconductor device includes a plurality of features for performing the functionality of the standard cell. The standard cell further includes a first sensitivity region adjacent to a first edge of the standard cell. The standard cell further includes anchor nodes linked to corresponding features of the plurality of features, wherein a number of anchor nodes linked to each feature of the corresponding features is based on a position of an end of each feature of the corresponding features relative to the first sensitivity region.


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