The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 14, 2020

Filed:

Dec. 04, 2015
Applicant:

Showa Denko K.k., Tokyo, JP;

Inventors:

Shinya Sato, Tokyo, JP;

Tatsuo Fujimoto, Tokyo, JP;

Masakazu Katsuno, Tokyo, JP;

Hiroshi Tsuge, Tokyo, JP;

Masashi Nakabayashi, Tokyo, JP;

Assignee:

SHOWA DENKO K.K., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C30B 23/02 (2006.01); C30B 29/36 (2006.01); C01B 32/963 (2017.01); C23C 14/06 (2006.01); C23C 14/24 (2006.01);
U.S. Cl.
CPC ...
C30B 23/025 (2013.01); C01B 32/963 (2017.08); C23C 14/0635 (2013.01); C23C 14/243 (2013.01); C30B 29/36 (2013.01);
Abstract

The present invention provides a method for producing an SiC single crystal, enabling obtaining an SiC single crystal substrate in which a screw dislocation-reduced region is ensured in a wide range, and an SiC single crystal substrate. The SiC single crystal substrate is produced using a seed crystal having an off angle in the off orientation from a {0001} plane by a production method wherein in advance of a growth main step of performing crystal growth to form a facet {0001} plane in the crystal peripheral part on the crystal end face having grown thereon the bulk silicon carbide single crystal and obtain more than 50% of the thickness of the obtained SiC single crystal, a growth sub-step of growing the crystal at a higher nitrogen concentration than in the growth main step and at a growth atmosphere pressure of 3.9 to 39.9 kPa and a seed crystal temperature of 2,100° C. to less than 2,300° C. is included.


Find Patent Forward Citations

Sato, Shinya. (2020). Method for producing silicon carbide single crystal and silicon carbide single crystal substrate (U.S. Patent No. 10711369). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10711369

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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