The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Jun. 26, 2019
Applicant:

Sandisk Technologies Llc, Addison, TX (US);

Inventors:

Xiang Yang, San Jose, CA (US);

Brian Murphy, San Jose, CA (US);

Lito De La Rama, San Jose, CA (US);

Assignee:

SanDisk Technologies LLC, Addison, TX (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/34 (2006.01); H01L 27/1157 (2017.01); G11C 16/08 (2006.01); G11C 16/12 (2006.01); G11C 16/04 (2006.01);
U.S. Cl.
CPC ...
H01L 27/1157 (2013.01); G11C 16/0483 (2013.01); G11C 16/08 (2013.01); G11C 16/12 (2013.01);
Abstract

A source side programming method and system are provided. A bad trigger block, of a plurality of blocks of a memory array, may be detected by determining a threshold voltage distribution of a drain side select gate of a block and determining whether the distribution is abnormal. If the distribution is abnormal, the block is a bad trigger block which may cause a failure in another block. IF the block is a bad trigger block, source side programming is performed on at least one word line of the bad trigger block by applying a non-zero voltage to at least one source side word line of the bad trigger block via a source side line.


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