The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 07, 2020

Filed:

Aug. 14, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Peng-Soon Lim, Johor, MY;

Zi-Wei Fang, Hsinchu County, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/8234 (2006.01); H01L 27/088 (2006.01); H01L 21/285 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 21/82345 (2013.01); H01L 21/823431 (2013.01); H01L 21/823456 (2013.01); H01L 27/0886 (2013.01); H01L 21/28562 (2013.01); H01L 21/28568 (2013.01); H01L 29/66545 (2013.01);
Abstract

A method includes forming in sequence a metallic capping layer and a dummy gate electrode layer over a semiconductor substrate; patterning the metallic capping layer and the dummy gate electrode layer to form a first stacked structure including a first portion of the metallic capping layer and a first portion of the dummy gate electrode layer; forming a plurality of first gate spacers on opposite sides of the first stacked structure; removing the first portion of the dummy gate electrode layer to expose the first portion of the metallic capping layer; and forming a first work function metal layer on the first portion of the metallic capping layer.


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