The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 30, 2020

Filed:

Apr. 22, 2016
Applicant:

The Institute of Microelectronics of Chinese Academy of Sciences, Beijing, CN;

Inventors:

Hangbing Lv, Beijing, CN;

Ming Liu, Beijing, CN;

Qi Liu, Beijing, CN;

Shibing Long, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 45/00 (2006.01);
U.S. Cl.
CPC ...
H01L 45/1266 (2013.01); H01L 45/08 (2013.01); H01L 45/085 (2013.01); H01L 45/1233 (2013.01); H01L 45/1273 (2013.01); H01L 45/142 (2013.01); H01L 45/144 (2013.01); H01L 45/16 (2013.01); H01L 45/1683 (2013.01);
Abstract

The present invention discloses a preparation method of a Cu-based resistive random access memory, and a memory. The preparation method includes: performing composition and a chemical combination treatment on a lower copper electrode () to generate a compound buffer layer (), wherein the compound buffer layer () is capable of preventing the oxidation of the lower copper electrode (); depositing a solid electrolyte material () on the compound buffer layer (); and depositing an upper electrode () on the solid electrolyte material () to form the memory. In the above technical solution, the compound buffer layer () capable of preventing the oxidation of the lower copper electrode () is inserted between the lower copper electrode () and the solid electrolyte material () to efficiently prevent the oxidation of the lower copper electrode () in a growth process of the solid electrolyte material (), such that an electrode interface does not become rough due to the oxidation, thereby solving the technical problem of relatively low reliability and yield of the device resulting from the rough electrode interface of the Cu-based resistive random access memory in the prior art, and thus the reliability and the yield of the device are improved.


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