The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 2020
Filed:
Dec. 04, 2018
Applicant:
Micron Technology, Inc., Boise, ID (US);
Inventors:
Aswin Thiruvengadam, Folsom, CA (US);
Sivagnanam Parthasarathy, Carlsbad, CA (US);
Daniel Scobee, Ione, CA (US);
Assignee:
MICRON TECHNOLOGY, INC., Boise, ID (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/56 (2006.01); G11C 13/00 (2006.01); G11C 29/12 (2006.01);
U.S. Cl.
CPC ...
G11C 13/004 (2013.01); G11C 13/0069 (2013.01); G11C 29/12 (2013.01); G11C 29/56 (2013.01);
Abstract
An indication that a test resource of a test platform has failed can be received. The test resource can be associated with performing a portion of a test of memory components. A characteristic of the test resource that failed can be determined. Another test resource of the test platform can be identified based on the characteristic of the test resource that failed. The portion of the test of memory components can be performed based on the another test resource of the test platform.