The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 26, 2020

Filed:

May. 22, 2019
Applicant:

Micron Technology, Inc., Boise, ID (US);

Inventors:

Innocenzo Tortorelli, Cernusco Sul Naviglio, IT;

Andrea Redaelli, Casatenovo, IT;

Agostino Pirovano, Milan, IT;

Fabio Pellizzer, Boise, ID (US);

Mario Allegra, Milan, IT;

Paolo Fantini, Vimercate, IT;

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 13/02 (2006.01); G11C 13/00 (2006.01); G11C 11/56 (2006.01); H01L 27/24 (2006.01); H01L 45/00 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0069 (2013.01); G11C 11/5678 (2013.01); G11C 13/0004 (2013.01); G11C 13/004 (2013.01); G11C 13/0038 (2013.01); G11C 13/0061 (2013.01); H01L 27/2463 (2013.01); G11C 13/0026 (2013.01); G11C 13/0028 (2013.01); G11C 2013/0052 (2013.01); G11C 2013/0092 (2013.01); G11C 2213/30 (2013.01); G11C 2213/71 (2013.01); H01L 45/1253 (2013.01); H01L 45/141 (2013.01);
Abstract

Methods, systems, and devices related to techniques to access a self-selecting memory device are described. A self-selecting memory cell may store one or more bits of data represented by different threshold voltages of the self-selecting memory cell. A programming pulse may be varied to establish the different threshold voltages by modifying one or more time durations during which a fixed level of voltage or current is maintained across the self-selecting memory cell. The self-selecting memory cell may include a chalcogenide alloy. A non-uniform distribution of an element in the chalcogenide alloy may determine a particular threshold voltage of the self-selecting memory cell. The shape of the programming pulse may be configured to modify a distribution of the element in the chalcogenide alloy based on a desired logic state of the self-selecting memory cell.


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