The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 2020

Filed:

Mar. 30, 2016
Applicant:

Canon Kabushiki Kaisha, Tokyo, JP;

Inventors:

Xiaoming Lu, Cedar Park, TX (US);

Philip D. Schumaker, Austin, TX (US);

Byung-Jin Choi, Austin, TX (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 59/00 (2006.01); G03F 7/00 (2006.01); G03F 7/20 (2006.01); B29C 59/02 (2006.01); H01L 21/687 (2006.01); B29L 31/00 (2006.01);
U.S. Cl.
CPC ...
B29C 59/002 (2013.01); G03F 7/0002 (2013.01); G03F 7/707 (2013.01); G03F 7/70691 (2013.01); B29C 59/022 (2013.01); B29L 2031/00 (2013.01); G03F 7/0027 (2013.01); H01L 21/687 (2013.01);
Abstract

An imprint lithography system that pressurizes and depressurizes an air cavity behind a retained imprint template or substrate so as to deflect the template or substrate to aid in filling the template pattern with fluid resist and/or separating the template from the cured resist on the substrate. The system includes a controller, pressure sensors, and an impedance valve for modulating the air cavity pressure so as to reduce pressure wave oscillations within the cavity that otherwise negatively impact overlay accuracy control, fluid spread control and separation control.


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