The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 2020
Filed:
May. 03, 2019
Applicant:
Sigray, Inc., Concord, CA (US);
Inventors:
Wenbing Yun, Walnut Creek, CA (US);
Sylvia Jia Yun Lewis, San Francisco, CA (US);
Janos Kirz, Berkeley, CA (US);
Alan Francis Lyon, Berkeley, CA (US);
Assignee:
Sigray, Inc., Concord, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/00 (2006.01); A61B 6/03 (2006.01); H01J 35/08 (2006.01); H01J 35/12 (2006.01); G01N 23/046 (2018.01); G01N 23/041 (2018.01); A61B 6/04 (2006.01);
U.S. Cl.
CPC ...
A61B 6/484 (2013.01); A61B 6/032 (2013.01); A61B 6/035 (2013.01); A61B 6/40 (2013.01); A61B 6/4007 (2013.01); A61B 6/4035 (2013.01); A61B 6/4291 (2013.01); A61B 6/502 (2013.01); A61B 6/508 (2013.01); G01N 23/041 (2018.02); G01N 23/046 (2013.01); H01J 35/08 (2013.01); H01J 35/112 (2019.05); H01J 35/12 (2013.01); A61B 6/04 (2013.01); A61B 6/0407 (2013.01); A61B 6/0457 (2013.01); A61B 6/42 (2013.01); A61B 6/4208 (2013.01); A61B 6/4233 (2013.01); G21K 2207/005 (2013.01);
Abstract
An x-ray imaging system includes an x-ray source, a beam-splitting grating having a plurality of structures arranged in a two-dimensional periodic array, a stage configured to hold an object to be imaged, and an x-ray detector having a two-dimensional array of x-ray detecting elements and positioned to detect x-rays diffracted by the beam-splitting grating and perturbed by the object to be imaged.