The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 2020

Filed:

Feb. 23, 2018
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Michiko Nakaya, Miyagi, JP;

Masanobu Honda, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3065 (2006.01); H01J 37/32 (2006.01); H01L 21/768 (2006.01); H01L 21/311 (2006.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
H01L 21/30655 (2013.01); H01J 37/32 (2013.01); H01L 21/0212 (2013.01); H01L 21/02274 (2013.01); H01L 21/31116 (2013.01); H01L 21/31144 (2013.01); H01L 21/7682 (2013.01); H01J 2237/3327 (2013.01); H01J 2237/3347 (2013.01);
Abstract

A processing method including a first step of supplying a first gas including a carbon-containing gas and an inert gas into an inside of a chamber and a second step of generating plasma from the supplied first gas by applying high frequency power for generating plasma and causing a chemical compound including organic matter on a pattern of a predetermined film formed on an object to be processed, wherein a ratio of the carbon-containing gas relative to the inert gas included in the first gas is 1% or less.


Find Patent Forward Citations

Nakaya, Michiko. (2020). Processing method and plasma processing apparatus (U.S. Patent No. 10651044). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10651044

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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