The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 2020
Filed:
Jun. 08, 2018
Winbond Electronics Corp., Taichung, TW;
Lih-Wei Lin, Hsinchu, TW;
Tsung-Huan Tsai, Taichung, TW;
Ju-Chieh Cheng, Hemei Township, Changhua County, TW;
WINBOND ELECTRONICS CORP., Taichung, TW;
Abstract
A memory-testing method is adapted in a memory circuit including a first block and a second block including a plurality of row addresses and column addresses. The memory-testing method includes: selecting one of the row addresses and one of the column addresses as a testing row and a testing column according to selection logic; selecting sampled column addresses of the testing row and sampled row addresses of the testing column according to a sampling process; executing the read operation on the sampled column addresses of the testing row and the sampled row addresses of the testing column in the first block; determining whether the read fail rate of the first block exceeds a predetermined ratio; and marking the first block as an input/output fail when the read fail rate exceeds the predetermined ratio.