The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 21, 2020

Filed:

Feb. 22, 2018
Applicant:

Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;

Inventors:

Han-Pin Chung, Kaohsiung, TW;

Jian-Shiou Huang, Fangliao Township, Pingtung County, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/8238 (2006.01); H01L 21/762 (2006.01); H01L 29/161 (2006.01); H01L 29/06 (2006.01); H01L 29/10 (2006.01); H01L 29/16 (2006.01); H01L 27/092 (2006.01);
U.S. Cl.
CPC ...
H01L 21/823878 (2013.01); H01L 21/76224 (2013.01); H01L 21/76229 (2013.01); H01L 21/823807 (2013.01); H01L 21/823821 (2013.01); H01L 27/0924 (2013.01); H01L 29/0649 (2013.01); H01L 29/1054 (2013.01); H01L 29/16 (2013.01); H01L 29/161 (2013.01);
Abstract

A semiconductor device structure and a method for forming the same are provided. The semiconductor device structure includes a first fin structure protruding from the first region of the semiconductor substrate and having a first portion and a second portion over the first portion. The semiconductor device structure also includes a liner structure including a first insulating liner layer and second insulating liner layer. The first insulating liner layer has a bottom portion covering the semiconductor substrate and a sidewall portion covering a sidewall of the first portion of the first fin structure. The second insulating liner layer is over the bottom portion and the sidewall portion of the first insulating liner layer and extends on a top surface of the sidewall portion of the first insulating liner layer. The semiconductor device structure also includes an isolation feature over the liner structure.


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