The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 07, 2020

Filed:

Jun. 21, 2017
Applicant:

Intel Corporation, Santa Clara, CA (US);

Inventors:

Janusz P. Jurski, Hillsboro, OR (US);

Tozer J. Bandorawalla, Portland, OR (US);

Ramkumar Nagappan, Chandler, AZ (US);

Mariusz Oriol, Gdynia, PL;

Piotr Sawicki, Gdansk, PL;

Robin A. Steinbrecher, Olympia, WA (US);

Shankar Krishnan, Portland, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01K 3/08 (2006.01); F24F 11/30 (2018.01); H05K 7/20 (2006.01); G01K 1/02 (2006.01); F24F 11/32 (2018.01); F24F 110/00 (2018.01);
U.S. Cl.
CPC ...
G01K 3/08 (2013.01); F24F 11/30 (2018.01); G01K 1/026 (2013.01); H05K 7/20745 (2013.01); H05K 7/20836 (2013.01); F24F 11/32 (2018.01); F24F 2110/00 (2018.01);
Abstract

An apparatus is provided which comprises: a first circuitry to receive a measurement of a first temperature of a section of a computing device during a first loading condition of the computing device, and to receive a measurement of a second temperature of the section of the computing device during a second loading condition of the computing device; and a second circuitry to detect a potential fault in a cooling system to cool the computing device, based at least in part on the first temperature and the second temperature.


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