The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Sep. 16, 2019
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:
Assignee:

ASMl Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 25/00 (2006.01); H01L 23/528 (2006.01); G06F 17/50 (2006.01); H01L 21/768 (2006.01); G03F 7/20 (2006.01); H01L 25/065 (2006.01); H01L 27/02 (2006.01); H01L 29/06 (2006.01); H01L 21/263 (2006.01); H01L 27/06 (2006.01);
U.S. Cl.
CPC ...
H01L 23/528 (2013.01); G03F 7/2059 (2013.01); G06F 17/5068 (2013.01); G06F 17/5077 (2013.01); H01L 21/263 (2013.01); H01L 21/768 (2013.01); H01L 25/0655 (2013.01); H01L 27/0207 (2013.01); H01L 29/0684 (2013.01); H01L 29/0692 (2013.01); G03F 7/2061 (2013.01); H01L 27/0617 (2013.01);
Abstract

Method of manufacturing electronic devices using a maskless lithographic exposure system using a maskless pattern writer. The method comprises generating beamlet control data for controlling the maskless pattern writer to expose a wafer for creation of the electronic devices, wherein the beamlet control data is generated based on a feature data set defining features selectable for individualizing the electronic devices, wherein exposure of the wafer according to the beamlet control data results in exposing a pattern having a different selection of the features from the feature data set for different subsets of the electronic devices.


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