The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 24, 2020

Filed:

Feb. 04, 2019
Applicant:

Applied Materials, Inc., Santa Clara, CA (US);

Inventors:

Guoheng Zhao, Palo Alto, CA (US);

Jeremy Rolfe Nesbitt, San Jose, CA (US);

Christopher Dennis Bencher, Cupertino, CA (US);

Mehdi Vaez-Iravani, Los Gatos, CA (US);

Assignee:

APPLIED MATERIALS, INC., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G03F 7/70291 (2013.01); G02B 26/0833 (2013.01); G03F 7/7015 (2013.01); G03F 7/70075 (2013.01);
Abstract

The present disclosure generally relates to lithography devices comprising an image projection system. The image projection system comprises a fiber bundle coupled to a first homogenizer and a second homogenizer. The first homogenizer is offset from the second homogenizer along a scan direction. The first homogenizer is optically aligned with a first digital micromirror device, and the second homogenizer is optically aligned with a second digital micromirror device. The first digital micromirror device is offset from the second digital micromirror device along the scan direction within an optical field of view of a projection lens. A scan field of the first digital micromirror device overlaps or aligns with a scan field of the second digital micromirror device to eliminate a gap between the scan field of the first digital micromirror device and the scan field of the second digital micromirror device.


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Zhao, Guoheng. (2020). Digital lithography with extended field size (U.S. Patent No. 10599044). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10599044

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