The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 17, 2020

Filed:

Apr. 19, 2017
Applicants:

Semiconductor Manufacturing International (Shanghai) Corporation, Shanghai, CN;

Semiconductor Manufacturing International (Beijing) Corporation, Beijing, CN;

Inventors:

De Yan Chen, Shanghai, CN;

Yan Chun Ma, Shanghai, CN;

Dae-Sub Jung, Shanghai, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 29/66 (2006.01); H01L 29/78 (2006.01); H01L 29/10 (2006.01); H01L 21/265 (2006.01); H01L 21/266 (2006.01); H01L 21/3213 (2006.01);
U.S. Cl.
CPC ...
H01L 29/66681 (2013.01); H01L 21/266 (2013.01); H01L 21/26586 (2013.01); H01L 21/32133 (2013.01); H01L 21/32139 (2013.01); H01L 29/1045 (2013.01); H01L 29/66659 (2013.01); H01L 29/7835 (2013.01);
Abstract

The present disclosure provides a method for forming a semiconductor device, including: providing a substrate; forming a gate material layer over the substrate; performing a first etching process on the gate material layer to remove a first portion of the gate material layer and expose a first portion of the substrate; performing a first ion implantation process on the first portion of the substrate to form a body region in the substrate, the body region being doped with first dopant ions and extending to under a remaining portion of the gate material layer; and forming a gate electrode by performing a second etching process on the remaining portion of the gate material layer to remove a second portion of the gate material layer, the second portion of the gate material layer being located on a side away from the body region.


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