The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 18, 2020

Filed:

Nov. 01, 2017
Applicants:

United Microelectronics Corp., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;

Inventors:

Feng-Yi Chang, Tainan, TW;

Fu-Che Lee, Taichung, TW;

Chieh-Te Chen, Kaohsiung, TW;

Assignees:

UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B81C 1/00 (2006.01); G03F 7/00 (2006.01); H01L 21/768 (2006.01); H01L 21/311 (2006.01); H01L 23/528 (2006.01); H01L 21/033 (2006.01);
U.S. Cl.
CPC ...
B81C 1/00087 (2013.01); B81C 1/00031 (2013.01); G03F 7/0002 (2013.01); G03F 7/0035 (2013.01); H01L 21/0337 (2013.01); H01L 21/31144 (2013.01); H01L 21/76802 (2013.01); H01L 21/76813 (2013.01); H01L 21/76816 (2013.01); H01L 23/528 (2013.01); B81C 2201/013 (2013.01); B81C 2201/0156 (2013.01);
Abstract

A method of forming a semiconductor device includes following steps. First of all, plural first openings and plural second openings are sequentially formed on a material layer disposed on a substrate, with the second openings across the first openings to form plural overlapped regions. Then, plural patterns arranged in an array arrangement are formed, with each pattern overlapped each overlapped region, respectively. After that, transferring the first openings, the second openings and the patterns to the material layer, to from plural material patterns in an array arrangement. In another embodiment of the present invention, the first openings and the second openings may be replaced by plural first patterns and plural second patterns, while the patterns are replaced by plural openings.


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