The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 17, 2019
Filed:
Feb. 22, 2018
Taiwan Semiconductor Manufacturing Company, Ltd., Hsinchu, TW;
Guenole Jan, San Jose, CA (US);
Huanlong Liu, Sunnyvale, CA (US);
Jian Zhu, San Jose, CA (US);
Yuan-Jen Lee, Fremont, CA (US);
Po-Kang Wang, Los Altos, CA (US);
TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD., Hsinchu, TW;
Abstract
A stimulus/response controller within a magnetic electrical test apparatus is configured for generating and transmitting stimulus waveforms to a high-speed DAC for application to a MTJ DUT. The response signal from the MTJ DUT is applied to an ADC that digitizes and transfers the response signal to the stimulus/response controller. The stimulus/response controller has a configurable function circuit that is selectively configured for performing evaluation and analysis of the digitized stimulus and response signals. The configurable functions are structured for performing any evaluation and analysis function for determining the characteristics of the MTJ DUT(s). Examples of the evaluation and analysis operations include averaging the stimulus and/or response signals, determining the differential resistance, the degradation times, failure counts, or the bit error rate of the MTJ DUT(s). The evaluations and analysis of the MTJ DUT are then available for transfer to a tester controller within the magnetic electrical test apparatus.