The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 03, 2019

Filed:

Aug. 28, 2017
Applicant:

Stmicroelectronics International N.v., Schiphol, NL;

Inventors:

Venkata Narayanan Srinivasan, Gautam Budh Nagar District, IN;

Manish Sharma, Gurgaon, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/3185 (2006.01); G06F 11/267 (2006.01); G06F 11/27 (2006.01); G01R 31/3183 (2006.01); G01R 31/317 (2006.01);
U.S. Cl.
CPC ...
G01R 31/318533 (2013.01); G01R 31/31705 (2013.01); G01R 31/318307 (2013.01); G01R 31/318519 (2013.01); G01R 31/318555 (2013.01); G01R 31/318563 (2013.01); G06F 11/267 (2013.01); G06F 11/27 (2013.01); G01R 31/318558 (2013.01);
Abstract

A circuit is for coupling test access port (TAP) signals to a Joint Test Action Group (JTAG) interface in an integrated circuit package. An nTRST pin receives a test reset signal, a TMS pin receives a test mode select signal, a testing test access port (TAP) has a test reset signal input and a test mode select signal input, and a debugging test access port (TAP) has a test reset signal input coupled to the nTRST pin and a test mode select signal input coupled to the TMS pin. An inverter has an input coupled to the nTRST pin and an output coupled to the test reset signal input of the testing TAP, and an AND gate has a first input coupled to the output of the inverter, a second input coupled to the TMS pin, and an output coupled to the test mode select input of the testing TAP.


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