The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2019
Filed:
Sep. 15, 2015
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 5/00 (2006.01); G06T 5/50 (2006.01); G06T 3/40 (2006.01); G06T 5/30 (2006.01);
U.S. Cl.
CPC ...
G06T 5/007 (2013.01); G06T 5/003 (2013.01); G06T 5/50 (2013.01); G06T 3/4076 (2013.01); G06T 5/002 (2013.01); G06T 5/006 (2013.01); G06T 5/30 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/10152 (2013.01); G06T 2207/20221 (2013.01);
Abstract
An object is illuminated sequentially using at least two illumination geometries. An intensity image of the object is captured for each one of the at least two illumination geometries. The intensity images are combined for producing a results image. Combining is carried out in such a way that the results image satisfies a predetermined optimization criterion. By way of example, the optimization criterion may relate to an image contrast, an edge steepness or an image sharpness. Optimization may be carried out with a spatial resolution.