The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 29, 2019
Filed:
Aug. 15, 2018
P & P Optica Inc., Waterloo, CA;
Krishna Iyer, Waterloo, CA;
Olga Ewa Pawluczyk, Waterloo, CA;
Bradley Oldenburg, Waterloo, CA;
Simon Guthrie, Waterloo, CA;
Timothy M. F. Stork, Kitchener, CA;
Ewa Osika, Cambridge, CA;
David William Lizius, Guelph, CA;
Romuald Pawluczyk, Conestogo, CA;
Anthony Robert Shaw, Waterloo, CA;
Alexander Baran-Harper, Waterloo, CA;
P & P OPTICA INC., Waterloo, Ontario, CA;
Abstract
A device and system for optically analyzing food products is provided. The device comprises first and second imaging devices respectively sensitive to first and second wavelengths; the imaging devices include a line-scan camera to acquire images of food products at a line in a food-path-facing direction, and a line-scan spectrometer to acquire spectroscopic images at the line. The device includes an optical filter configured to: convey the first wavelengths from the line to the first imaging device; and convey the second wavelengths from the line to the second imaging device. The device includes a frame to align the optical filter and respective optical axes of the first and second imaging devices, relative to each other and the food-path-facing direction, such that the first imaging device and the second imaging device are optically aligned via the optical filter to image the line.