The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 17, 2019

Filed:

Feb. 02, 2017
Applicant:

United Microelectronics Corp., Hsin-Chu, TW;

Inventors:

En-Chiuan Liou, Tainan, TW;

Hon-Huei Liu, Kaohsiung, TW;

Chia-Hung Lin, Tainan, TW;

Yu-Cheng Tung, Kaohsiung, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); H01L 21/66 (2006.01); H01L 21/027 (2006.01); H01L 29/66 (2006.01);
U.S. Cl.
CPC ...
H01L 22/12 (2013.01); H01L 21/0277 (2013.01); H01L 29/66795 (2013.01);
Abstract

A method of patterning a semiconductor device includes following steps. First of all, a substrate is provided, and a first target pattern is formed in the substrate. Next, a second target pattern is formed on the substrate, across the first target pattern. Then, a third pattern is formed on a hard mask layer formed on the substrate, by using an electron beam apparatus, wherein two opposite edges of the third pattern are formed under an asymmetry control.


Find Patent Forward Citations

Liou, En-Chiuan. (2019). Method of patterning semiconductor device (U.S. Patent No. 10418290). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10418290

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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