The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 17, 2019
Filed:
Mar. 21, 2018
Sigray, Inc., Concord, CA (US);
Wenbing Yun, Walnut Creek, CA (US);
Srivatsan Seshadri, Pleasnton, CA (US);
Sylvia Jia Yun Lewis, San Francisco, CA (US);
Janos Kirz, Berkeley, CA (US);
Alan Francis Lyon, Berkeley, CA (US);
Benjamin Donald Stripe, Walnut Creek, CA (US);
Sigray, Inc., Concord, CA (US);
Abstract
A method for performing x-ray absorption spectroscopy and an x-ray absorption spectrometer system to be used with a compact laboratory x-ray source to measure x-ray absorption of the element of interest in an object with both high spatial and high spectral resolution. The spectrometer system comprises a compact high brightness laboratory x-ray source, an optical train to focus the x-rays through an object to be examined, and a spectrometer comprising a single crystal analyzer (and, in some embodiments, also a mosaic crystal) to disperse the transmitted beam onto a spatially resolving x-ray detector. The high brightness/high flux x-ray source may have a take-off angle between 0 and 105 mrad. and be coupled to an optical train that collects and focuses the high flux x-rays to spots less than 500 micrometers, leading to high flux density. The coatings of the optical train may also act as a 'low-pass' filter, allowing a predetermined bandwidth of x-rays to be observed at one time while excluding the higher harmonics.