The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 30, 2019

Filed:

Jul. 27, 2017
Applicants:

United Microelectronics Corp., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian province, CN;

Inventors:

Feng-Yi Chang, Tainan, TW;

Fu-Che Lee, Taichung, TW;

Chieh-Te Chen, Kaohsiung, TW;

Yi-Ching Chang, Pingtung County, TW;

Assignees:

UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;

Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/033 (2006.01); H01L 21/3213 (2006.01); H01L 27/115 (2017.01);
U.S. Cl.
CPC ...
H01L 21/0337 (2013.01); H01L 21/0332 (2013.01); H01L 21/32139 (2013.01); H01L 27/115 (2013.01);
Abstract

A method of forming a semiconductor device includes the following steps. First of all, a material layer is formed on a substrate, and a sidewall image transferring process is performed to form plural first mask patterns on the material layer, with the first mask patterns parallel extended along a first direction. Next, a pattern splitting process is performed to remove a portion of the first mask patterns to form plural second openings, with the second openings parallel extended along a second direction, across the first mask patterns. Then, the material layer is patterned by using rest portions of the first mask patterns as a mask to form plural patterns arranged in an array.


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