The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 23, 2019
Filed:
Sep. 19, 2016
Lam Research Corporation, Fremont, CA (US);
Quan Ma, Tigard, OR (US);
Shantinath Ghongadi, Tigard, OR (US);
Zhian He, Lake Oswego, OR (US);
Bryan Pennington, Sherwood, OR (US);
Tariq Majid, Wilsonville, OR (US);
Jonathan David Reid, Sherwood, OR (US);
Lam Research Corporation, Fremont, CA (US);
Abstract
Various embodiments herein relate to methods and apparatus for electroplating metal on a substrate. In many cases, an electroplating process may be monitored to ensure that it is operating within a pre-defined processing window. This monitoring may involve application of a controlled potential between the substrate and a reference electrode after the electroplating process is substantially complete (e.g., after recessed features on the substrate are substantially filled). The current delivered to the substrate during application of the controlled potential is monitored, and a peak current is determined. This peak current, often referred to herein as the potential-controlled exit peak current, can be compared against an expected range to determine whether the electroplating process is operating as desired.