The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 16, 2019

Filed:

Mar. 28, 2014
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventor:

Masahiro Sakurada, Annaka, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/146 (2006.01); H01L 31/06 (2012.01); H01L 31/068 (2012.01); H01L 29/167 (2006.01); H01L 21/02 (2006.01); C30B 29/06 (2006.01); C30B 15/00 (2006.01); C30B 25/02 (2006.01); H01L 21/322 (2006.01); C30B 25/20 (2006.01); C30B 29/68 (2006.01); C30B 31/02 (2006.01);
U.S. Cl.
CPC ...
H01L 29/167 (2013.01); C30B 15/00 (2013.01); C30B 25/02 (2013.01); C30B 25/20 (2013.01); C30B 29/06 (2013.01); C30B 29/68 (2013.01); C30B 31/02 (2013.01); H01L 21/02576 (2013.01); H01L 21/02579 (2013.01); H01L 21/3225 (2013.01); H01L 21/02381 (2013.01); H01L 21/02532 (2013.01); H01L 21/02573 (2013.01);
Abstract

A silicon epitaxial wafer including: a second intermediate epitaxial layer on a silicon substrate produced by being cut from a silicon single crystal ingot grown by the CZ method so as to have a carbon concentration ranging from 3×10to 2×10atoms/cm, a first intermediate epitaxial layer doped with a dopant, and an epitaxial layer of a device forming region stacked on the first intermediate epitaxial layer, and to a method of producing this wafer. Also providing an industrially excellent silicon epitaxial wafer that is produced with a silicon substrate doped with carbon and used as a semiconductor device substrate such as a memory, a logic, or a solid-state image sensor, and a method of producing this silicon epitaxial wafer.


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