The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 09, 2019

Filed:

Mar. 01, 2017
Applicant:

Globalfoundries Singapore Pte. Ltd., Singapore, SG;

Inventors:

Purakh Raj Verma, Singapore, SG;

Kemao Lin, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 49/02 (2006.01); H01L 21/768 (2006.01); H01L 21/3205 (2006.01); H01L 23/522 (2006.01); H01L 23/532 (2006.01);
U.S. Cl.
CPC ...
H01L 28/24 (2013.01); H01L 21/32051 (2013.01); H01L 21/76802 (2013.01); H01L 21/76834 (2013.01); H01L 21/76877 (2013.01); H01L 23/5226 (2013.01); H01L 23/5228 (2013.01); H01L 23/53228 (2013.01);
Abstract

A method for forming a thin film resistor (TFR) without via penetration and the resulting device are provided. Embodiments include forming a first ILD over a substrate; forming a second ILD over the first ILD; forming a first metal layer in the second ILD; forming a first nitride layer over the second ILD and the first metal layer; forming a third ILD over the first nitride layer; forming vias through the third ILD and the first nitride layer, coupled to the first metal layer; forming a TFR layer over two of the vias and the third ILD between the two vias; forming a second nitride layer over the TFR layer and the third ILD; forming a fourth ILD over the second nitride layer; and forming a second metal layer in the fourth ILD and the second nitride layer.


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