The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 02, 2019
Filed:
Mar. 20, 2017
Fei Company, Hillsboro, OR (US);
Valerie Brogden, Portland, OR (US);
Jeffrey Blackwood, Portland, OR (US);
Michael Schmidt, Gresham, OR (US);
Dhruti Trivedi, Watervliet, NY (US);
Richard J. Young, Beaverton, OR (US);
Thomas G. Miller, Portland, OR (US);
Brian Roberts Routh, Jr., Beaverton, OR (US);
Stacey Stone, Brno, CZ;
Todd Templeton, Banks, OR (US);
FEI Company, Hillsboro, OR (US);
Abstract
Techniques are described that facilitate automated extraction of lamellae and attaching the lamellae to sample grids for viewing on transmission electron microscopes. Some embodiments of the invention involve the use of machine vision to determine the positions of the lamella, the probe, and/or the TEM grid to guide the attachment of the probe to the lamella and the attachment of the lamella to the TEM grid. Techniques that facilitate the use of machine vision include shaping a probe tip so that its position can be readily recognized by image recognition software. Image subtraction techniques can be used to determine the position of the lamellae attached to the probe for moving the lamella to the TEM grid for attachment. In some embodiments, reference structures are milled on the probe or on the lamella to facilitate image recognition.