The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 11, 2019

Filed:

Jun. 28, 2016
Applicant:

Technical Institute of Physics and Chemistry of the Chinese Academy of Sciences, Beijing, CN;

Inventors:

Xuanming Duan, Beijing, CN;

Xianzi Dong, Beijing, CN;

Meiling Zheng, Beijing, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/20 (2006.01); B23K 26/00 (2014.01);
U.S. Cl.
CPC ...
G03F 7/2053 (2013.01); B23K 26/00 (2013.01); G03F 7/2057 (2013.01); G03F 7/70025 (2013.01); G03F 7/7045 (2013.01); G03F 7/7055 (2013.01); G03F 7/70291 (2013.01); G03F 7/70383 (2013.01); G03F 7/70466 (2013.01); G03F 7/70508 (2013.01);
Abstract

A maskless photolithoghrapic system includes a laser point-by-point scanning exposure unit, a plane-projection exposure unit, a mobile station and a calculation control unit that decomposes a pattern to be exposed, so that a pattern portion with a precision requirement below a pre-determined threshold is exposed by the laser point-by-point scanning exposure unit, and a pattern portion with a precision requirement greater than the pre-determined threshold is exposed by the plane-projection exposure unit; when conducting laser point-by-point scanning exposure on a sample on the mobile station, the light emitted by the laser point-by-point scanning exposure unit moves relative to the sample according to the pattern portion with a precision requirement below the pre-determined threshold; and when conducting plane-projection exposure on the sample, the plane-projection exposure unit emits light with a corresponding pattern shape onto the sample according to the graph with a precision requirement greater than the pre-determined threshold.


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