The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 11, 2019
Filed:
Sep. 27, 2017
Applicant:
Infineon Technologies Ag, Neubiberg, DE;
Inventors:
Naveen Goud Ganagona, Villach, AT;
Moriz Jelinek, Villach, AT;
Helmut Oefner, Zorneding, DE;
Hans-Joachim Schulze, Taufkirchen, DE;
Werner Schustereder, Villach, AT;
Assignee:
INFINEON TECHNOLOGIES AG, Neubiberg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/3563 (2014.01); G01N 21/35 (2014.01);
U.S. Cl.
CPC ...
G01N 21/3563 (2013.01); G01N 2021/3568 (2013.01); G01N 2021/3572 (2013.01); G01N 2021/3595 (2013.01);
Abstract
A method of determining the carbon content in a silicon sample may include: generating electrically active polyatomic complexes within the silicon sample. Each polyatomic complex may include at least one carbon atom. The method may further include: determining a quantity indicative of the content of the generated polyatomic complexes in the silicon sample, and determining the carbon content in the silicon sample from the determined quantity.