The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jan. 09, 2018
Applicant:

Spin Memory, Inc., Fremont, CA (US);

Inventors:

Elizabeth A. Dobisz, San Jose, CA (US);

Prachi Shrivastava, Newark, CA (US);

Assignee:

SPIN MEMORY, INC., Fremont, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 43/12 (2006.01); H01L 43/02 (2006.01); H01L 21/469 (2006.01); G11C 11/16 (2006.01); H01L 21/027 (2006.01); H01L 51/00 (2006.01); H01L 21/033 (2006.01); H01B 3/44 (2006.01); H01L 21/47 (2006.01);
U.S. Cl.
CPC ...
H01L 43/12 (2013.01); G11C 11/161 (2013.01); H01B 3/447 (2013.01); H01B 3/448 (2013.01); H01L 21/0274 (2013.01); H01L 21/0337 (2013.01); H01L 21/0338 (2013.01); H01L 21/469 (2013.01); H01L 21/47 (2013.01); H01L 43/02 (2013.01); H01L 51/0015 (2013.01); G11C 2211/5615 (2013.01);
Abstract

A method for manufacturing a magnetic random access memory array at a density greater than would be possible using photolithography. A hard mask material is deposited over a magnetic memory element material, and a chemical template layer such as brush or mat material is deposited over the hard mask. A mask structure is formed over the soluble polymer. The mask structure is configured with openings having a center to center spacing that is an integer multiple of a block copolymer material. The openings in the mask structure can be shrunk by depositing a spacer material. The chemical template layer is chemically patterned, such as by a quick plasma exposure and the mask is removed. A block copolymer material is then deposited over the chemical template and annealed to form block copolymer cylinders that are located over the patterned portions of the chemical template and between the patterned portions.


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