The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 04, 2019
Filed:
Feb. 20, 2018
United Microelectronics Corp., Hsin-Chu, TW;
Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;
Feng-Yi Chang, Tainan, TW;
Fu-Che Lee, Taichung, TW;
Ying-Chih Lin, Tainan, TW;
Gang-Yi Lin, Taitung County, TW;
UNITED MICROELECTRONICS CORP., Hsin-Chu, TW;
Fujian Jinhua Integrated Circuit Co., Ltd., Quanzhou, Fujian Province, CN;
Abstract
A self-aligned double patterning method includes the steps of forming line structures spaced apart from each other in a first direction on a mask layer, forming dielectric layer on the line structures, performing an etch back process so that the top surfaces of the line structures and the dielectric layer are flush, forming layer structure with same material as the line structures on the line structures and the dielectric layer, forming spacers spaced apart from each other in a second direction on the layer structure, and performing an etch process with the spacers as an etch mask to pattern the line structures and the dielectric layer.