The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Mar. 22, 2017
Applicant:

Tokyo Electron Limited, Tokyo, JP;

Inventors:

Hiroki Murakami, Nirasaki, JP;

Daisuke Suzuki, Nirasaki, JP;

Takahiro Miyahara, Nirasaki, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); C23C 16/34 (2006.01); C23C 16/455 (2006.01); C23C 16/46 (2006.01); C23C 16/02 (2006.01); C23C 16/04 (2006.01);
U.S. Cl.
CPC ...
H01L 21/02312 (2013.01); C23C 16/02 (2013.01); C23C 16/04 (2013.01); C23C 16/345 (2013.01); C23C 16/45525 (2013.01); C23C 16/45544 (2013.01); C23C 16/46 (2013.01); H01L 21/0217 (2013.01); H01L 21/0228 (2013.01); H01L 21/02211 (2013.01); H01L 21/02271 (2013.01);
Abstract

There is provided a nitride film forming method which includes: performing a pretreatment in which a chlorine-containing gas is supplied while heating a substrate to be processed having a first base film and a second base film formed on the substrate to a predetermined temperature, and is adsorbed onto a surface of the first base film and a surface of the second base film; and forming a nitride film on the first base film and the second base film subjected to the pretreatment, by an ALD method or a CVD method, using a raw material gas and a nitriding gas, while heating the substrate to be processed to a predetermined temperature.


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