The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jun. 29, 2015
Applicant:

Asml Netherlands B.v., Veldhoven, NL;

Inventors:

Duan-Fu Stephen Hsu, Fremont, CA (US);

Feng-Liang Liu, Shenzhen, CN;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01); G03F 7/20 (2006.01); G03F 1/70 (2012.01); G03F 1/36 (2012.01);
U.S. Cl.
CPC ...
G03F 7/70433 (2013.01); G03F 1/36 (2013.01); G03F 1/70 (2013.01); G03F 7/7085 (2013.01); G03F 7/70125 (2013.01); G03F 7/70425 (2013.01); G03F 7/70441 (2013.01); G03F 7/70483 (2013.01); G06F 17/5081 (2013.01);
Abstract

Methods of reducing a pattern displacement error, contrast loss, best focus shift, and/or tilt of a Bossung curve of a portion of a design layout used in a lithographic process for imaging that portion onto a substrate using a lithographic apparatus. The methods include adjusting an illumination source of the lithographic apparatus, placing one or more assist features onto, or adjusting a position and/or shape of one or more existing assist features in, the portion. Adjusting the illumination source and/or the one or more assist features may be by an optimization algorithm.


Find Patent Forward Citations

Hsu, Duan-Fu. (2019). Optimization of assist features and source (U.S. Patent No. 10310386). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10310386

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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