The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 04, 2019

Filed:

Jan. 05, 2016
Applicant:

Shin-etsu Handotai Co., Ltd., Tokyo, JP;

Inventors:

Takuya Sasaki, Shirakawa, JP;

Yuki Tanaka, Nishigo-mura, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/08 (2012.01); B24B 37/24 (2012.01); B24B 49/18 (2006.01); H01L 21/67 (2006.01); B24B 53/017 (2012.01); G01N 23/223 (2006.01); H01L 21/304 (2006.01); H01L 21/306 (2006.01); B24B 37/00 (2012.01); H01L 21/02 (2006.01);
U.S. Cl.
CPC ...
B24B 53/017 (2013.01); B24B 37/00 (2013.01); B24B 37/08 (2013.01); B24B 37/24 (2013.01); B24B 49/18 (2013.01); G01N 23/223 (2013.01); H01L 21/02057 (2013.01); H01L 21/304 (2013.01); H01L 21/30625 (2013.01); H01L 21/67253 (2013.01); G01N 2223/6116 (2013.01); G01N 2223/652 (2013.01);
Abstract

A method for raising a polishing pad for polishing a silicon wafer, wherein a polishing pad made of foamed urethane resin is attached to a polishing machine, after dressing is performed, dummy polishing is performed, after processing to remove the polishing residues that have built up in the polishing pad by the dummy polishing is then performed, an amount of polishing residues in the polishing pad is measured, and a rise of the polishing pad subjected to the dummy polishing is judged based on the measured amount of polishing residues. As a result, a method for raising a polishing pad can improve the particle level in the polishing pad life early stage.


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