The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 14, 2019

Filed:

Nov. 16, 2016
Applicant:

Industrial Technology Research Institute, Hsinchu Hsien, TW;

Inventors:

Chih-Chung Chiu, Hsinchu, TW;

Chih-Ming Tzeng, Hsinchu, TW;

Li-Ling Liao, Hsinchu, TW;

Yu-Lin Chao, Hsinchu, TW;

Chih-Ming Shen, Hsinchu, TW;

Ming-Kaan Liang, Hsinchu, TW;

Chun-Kai Liu, Hsinchu, TW;

Ming-Ji Dai, Hsinchu, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/40 (2014.01); G01R 31/00 (2006.01); H02P 29/68 (2016.01); G01R 21/06 (2006.01); H02P 27/08 (2006.01);
U.S. Cl.
CPC ...
G01R 31/40 (2013.01); G01R 31/003 (2013.01); H02P 29/68 (2016.02); G01R 21/06 (2013.01); H02P 27/08 (2013.01);
Abstract

An intelligent diagnosis system for a power module. The system includes a power module, a hardware checking module and a diagnostic module. The power module has a temperature sensing element for obtaining a temperature difference between a starting minimum temperature and a current temperature. The hardware checking module has a current sensing element, a voltage sensing element and a magnetic coupling closed loop detection element for obtaining the current, the output voltage and the input voltage of the power module, and the hardware loop status, respectively. The diagnostic module calculates the number of cycles that have been operated, a measured impedance and an instantaneous power based on those measurement results, and calculating a risk index based on the number of cycles that have been operated, the temperature difference, the measured impedance, the instantaneous power and the hardware loop status, thereby determining the accumulation of the abnormality index record.


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