The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Mar. 08, 2016
Tokyo Electron Limited, Tokyo, JP;
Shunichi Mikami, Miyagi, JP;
TOKYO ELECTRON LIMITED, Tokyo, JP;
Abstract
There is provided a plasma etching method for etching a base film by a plasma using a photoresist as a mask. The method includes etching the base film by the plasma, under a first processing condition in which a selectivity of the photoresist to the base film is set to a first selectivity, while using as a mask the photoresist formed in a predetermined pattern by exposure and development and a scum remaining in the photoresist, without performing a process of removing the scum; and switching, during the etching of the base film, the first processing condition to a second processing condition in which the selectivity of the photoresist to the base film is set to a second selectivity lower than the first selectivity and further etching the base film by a plasma while using the photoresist as a mask under the second processing condition.