The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 07, 2019

Filed:

Oct. 16, 2013
Applicant:

Mitsubishi Materials Corporation, Tokyo, JP;

Inventors:

Keita Umemoto, Sanda, JP;

Shoubin Zhang, Sanda, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01J 37/34 (2006.01); C23C 14/34 (2006.01); C22C 9/00 (2006.01); C22C 1/04 (2006.01); B22F 3/10 (2006.01); B22F 3/14 (2006.01); B22F 3/15 (2006.01); B22F 3/24 (2006.01); C22C 28/00 (2006.01);
U.S. Cl.
CPC ...
H01J 37/3426 (2013.01); B22F 3/10 (2013.01); B22F 3/14 (2013.01); B22F 3/15 (2013.01); B22F 3/24 (2013.01); C22C 1/0425 (2013.01); C22C 9/00 (2013.01); C22C 28/00 (2013.01); C23C 14/3414 (2013.01); B22F 2003/247 (2013.01);
Abstract

A Cu—Ga binary alloy sputtering target having excellent mechanical workability, high density, and high bending strength, and a method of producing the sputtering target are provided. The sputtering target has a composition including 28 to 35 atomic % of Ga and the balance made of Cu and inevitable impurities. In addition, the sputtering target has a coexistence microstructure in which a low-Ga-containing Cu—Ga binary alloy phase is surrounded by a high-Ga-containing Cu—Ga binary alloy phase. The low-Ga-containing Cu—Ga binary alloy phase includes 26 atomic % or less of Ga and a balance made of Cu. The high-Ga-containing Cu—Ga binary alloy phase includes 28 atomic % or more of Ga.


Find Patent Forward Citations

Loading…