The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2019
Filed:
Aug. 12, 2014
Applicant:
Carl Zeiss Microscopy Gmbh, Jena, DE;
Inventors:
Ingo Kleppe, Jena, DE;
Yauheni Novikau, Jena, DE;
Ralf Netz, Jena, DE;
Michael Golles, Jena, DE;
Gunther Lorenz, Jena, DE;
Christoph Nieten, Jena, DE;
Assignee:
Carl Zeiss Microscopy GmbH, Jena, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/02 (2006.01); G02B 21/18 (2006.01); G02B 21/36 (2006.01); G02B 6/06 (2006.01); G02B 26/08 (2006.01);
U.S. Cl.
CPC ...
G02B 21/0072 (2013.01); G02B 6/06 (2013.01); G02B 21/008 (2013.01); G02B 21/0064 (2013.01); G02B 21/025 (2013.01); G02B 21/18 (2013.01); G02B 21/361 (2013.01); G02B 26/0816 (2013.01); G02B 26/0825 (2013.01); G02B 26/0833 (2013.01);
Abstract
Microscope and method for high resolution scanning microscopy of a sample, wherein
Kleppe, Ingo. (2019). High-resolution scanning microscopy (U.S. Patent No. 10281701). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10281701
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile