The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 30, 2019

Filed:

May. 23, 2014
Applicant:

Mattersight Corporation, Chicago, IL (US);

Inventors:

David Gustafson, Lake Bluff, IL (US);

Christopher Danson, Austin, TX (US);

Assignee:

MATTERSIGHT CORPORATION, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G09B 7/02 (2006.01);
U.S. Cl.
CPC ...
G09B 7/02 (2013.01);
Abstract

The methods, apparatus, and systems described herein evaluate written essays and determine student attributes from the essays. The methods include receiving an essay, identifying keywords in text of the essay associated with one or more student metrics, outputting a score for the essay for at least one student metric using a linguistic-based psychological behavioral model, and recommending teaching methods based on the score.


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Gustafson, David. (2019). Essay analytics system and methods (U.S. Patent No. 10276055). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/10276055

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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