The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 02, 2019

Filed:

Oct. 06, 2017
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-Do, KR;

Inventors:

Vladimir Volynets, Hwaseong-si, KR;

Protopopov Vladimir, Suwon-si, KR;

Young Do Kim, Hwaseong-si, KR;

Yuri Barsukov, Suwon-si, KR;

Sang Heon Lee, Seongnam-si, KR;

Sung Ho Jang, Hwaseong-si, KR;

Assignee:

SAMSUNG ELECTRONICS CO., LTD., Suwon-si, Gyeonggi-Do, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01); H01J 49/40 (2006.01); C23C 16/455 (2006.01); G01J 3/443 (2006.01); H01J 37/32 (2006.01); H01J 49/00 (2006.01); H01J 49/10 (2006.01); H01J 49/12 (2006.01); H01L 21/02 (2006.01); H01L 29/786 (2006.01); G01J 3/28 (2006.01);
U.S. Cl.
CPC ...
H01J 49/40 (2013.01); C23C 16/45502 (2013.01); G01J 3/2889 (2013.01); G01J 3/443 (2013.01); H01J 37/32963 (2013.01); H01J 49/0031 (2013.01); H01J 49/10 (2013.01); H01J 49/12 (2013.01); H01L 21/02274 (2013.01); H01L 29/78696 (2013.01); H01J 2237/327 (2013.01);
Abstract

A pulsed plasma analyzer includes a pulse modulator that controls an off-time of a pulsed plasma that includes a target radical, an optical spectrometer that measures optical emissions of the pulsed plasma after the off-time to determine optical emission data, and a concentration estimating module that estimates a concentration of the target radical during the off-time based on an initial optical emission value of the optical emission data that changes as a function of the off-time, and outputs an estimated concentration.


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