The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 26, 2019

Filed:

Sep. 19, 2017
Applicant:

Yield Microelectronics Corp., Chu-Pei, TW;

Inventors:

Hsin-Chang Lin, Chu-Pei, TW;

Wen-Chien Huang, Chu-Pei, TW;

Chia-Hao Tai, Chu-Pei, TW;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 16/04 (2006.01); H01L 27/11521 (2017.01); G11C 16/14 (2006.01); H01L 29/78 (2006.01); G11C 16/10 (2006.01); H01L 29/788 (2006.01);
U.S. Cl.
CPC ...
G11C 16/0433 (2013.01); G11C 16/10 (2013.01); G11C 16/14 (2013.01); H01L 27/11521 (2013.01); H01L 29/7833 (2013.01); H01L 29/7881 (2013.01);
Abstract

The present invention discloses a low voltage difference-operated EEPROM and an operating method thereof wherein at least one transistor structure is formed in a semiconductor substrate and each includes a first electric-conduction gate. An ion implantation is performed by masking partial regions to prevent the existence of the conventional lightly doped drain (LDD) structure. An undoped region is formed in the semiconductor substrate under the two sides of the first electric-conductive gate, to increase the intensity of electric field between the gate and the substrate or between the gate and the transistor, whereby to reduce the voltage differences required for writing and erasing. The present invention also discloses an operating method for the low voltage difference-operated EEPROM. The present invention applies to the EEPROM with a single gate transistor structure.


Find Patent Forward Citations

Loading…