The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2019

Filed:

Sep. 19, 2016
Applicant:

Stmicroelectronics International N.v., Amsterdam, NL;

Inventors:

Venkata Narayanan Srinivasan, Gautam Budh Nagar District, IN;

Nimit Endlay, Greater Noida, IN;

Balwinder Singh Soni, Faridabad, IN;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/317 (2006.01); G01R 31/3177 (2006.01); G01R 31/3193 (2006.01); G06F 11/26 (2006.01); G06F 11/25 (2006.01); G06F 11/27 (2006.01);
U.S. Cl.
CPC ...
G01R 31/31727 (2013.01); G01R 31/3177 (2013.01); G01R 31/31722 (2013.01); G01R 31/31723 (2013.01); G01R 31/31724 (2013.01); G01R 31/31937 (2013.01); G06F 11/25 (2013.01); G06F 11/26 (2013.01); G06F 11/27 (2013.01);
Abstract

A test circuit receives LBIST and ATPG mode signals, and generates a first output as high when in ATPG or LBIST, and a second output as low when in ATPG or LBIST. A multiplexing circuit receives an ATPG clock and functional clock, and outputs one. A clock gate circuit includes a first latch receiving the second output, and an enable input receiving an inverse of the ATPG clock or functional clock. A second latch receives the first output, and has an enable input receiving the inverse of the ATPG clock or functional clock. The clock gate circuit includes a first AND gate receiving output of the first latch and ATPG clock or functional clock, a second AND gate receiving output of the second latch and the ATPG clock or LBIST clock, and an OR gate receiving outputs of the first and second AND gates, and generating a test clock.


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