The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 26, 2019
Filed:
May. 29, 2018
Global Unichip Corporation, Hsinchu, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsinchu, TW;
Ting-Hao Wang, Hsinchu, TW;
Shih-Chun Lo, Hsinchu, TW;
GLOBAL UNICHIP CORPORATION, Hsinchu, TW;
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD., Hsinchu, TW;
Abstract
An ADC calibration system includes a clock generating circuit, under test ADCs, a standard ADC, and a calibration circuit. The clock generating circuit generates operation clocks according to a system clock, and generates a calibration clock according to the system clock and a selection signal. The under test ADCs sample an input signal according to the operation clocks to output under test sampling results. The standard ADC samples the input signal according to the calibration clock to output a standard sampling result. The calibration circuit makes the phases of the calibration clock and a first operation clock received by a first ADC to be the same. The calibration circuit compares the standard sampling result with a first under test sampling result to generate calibration information corresponding to the first under test sampling result, and calibrates the first under test sampling result according to the calibration information.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile