The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 19, 2019

Filed:

Nov. 30, 2016
Applicant:

Rohm and Haas Electronic Materials Cmp Holdings, Inc., Newark, DE (US);

Inventors:

Bryan E. Barton, Lincoln University, PA (US);

Michael E. Mills, Midland, MI (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
B24B 37/00 (2012.01); C08G 18/66 (2006.01); C08G 18/48 (2006.01); B24B 37/20 (2012.01); C08G 18/12 (2006.01); C08G 18/76 (2006.01);
U.S. Cl.
CPC ...
C08G 18/6681 (2013.01); B24B 37/20 (2013.01); C08G 18/12 (2013.01); C08G 18/4829 (2013.01); C08G 18/7671 (2013.01);
Abstract

A two component composition for making chemical mechanical polishing pad for polishing a semiconductor substrate is provided comprising a liquid aromatic isocyanate component having an unreacted isocyanate (NCO) concentration of from 15 to 40 wt. %, based on the total solids weight of the aromatic isocyanate component, such as methylene di(phenylisocyanate) (MDI), a liquid polyol component of a polyol having a polyether backbone and having from 5 to 7 hydroxyl groups per molecule, and a curative of one or more polyamine or diamine, wherein the reaction mixture comprises 50 to 65 wt. % of hard segment materials, based on the total weight of the reaction mixture. The composition when mixed cured to form a polyurethane reaction product. Also provided are CMP polishing pads made from the polyurethane reaction product by spraying the composition into a mold.


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