The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2019

Filed:

May. 02, 2018
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Inventors:

Sang-Uhn Cha, Hwasung-si, KR;

Hoi-Ju Chung, Hwasung-si, KR;

Uk-Song Kang, Seongnam-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 11/34 (2006.01); G06F 3/06 (2006.01); G11C 29/52 (2006.01); G06F 11/10 (2006.01); G11C 11/16 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0679 (2013.01); G06F 3/064 (2013.01); G06F 3/0619 (2013.01); G06F 11/106 (2013.01); G11C 29/52 (2013.01); G11C 11/1673 (2013.01); G11C 11/1675 (2013.01);
Abstract

A method of scrubbing errors from a semiconductor memory device including a memory cell array and an error correction circuit, can be provided by accessing a page of the memory cell array to provide a data that includes sub units that are separately writable to the page of memory and to provide parity data configured to detect and correct a bit error in the data and selectively enabling write-back of a selected sub unit of the data responsive to determining that the selected sub unit of data includes a correctable error upon access as part of an error scrubbing operation.


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